SWIR1024L3A-CL40K Short-Wave Infrared Camera

Product Introduction

SWIR1024L3A-CL40K is a 1024-pixel China-made InGaAs SWIR line-scan camera covering the 900–1700 nm range. It uses 12.5 µm × 12.5 µm pixels, CameraLink Full transmission, 14-bit ADC, 38K @ 1024 × 1 line-scan output, and cooling up to 40 °C below ambient.

Key Features

1024-pixel China-made InGaAs line-scan sensor
12.5 µm × 12.5 µm pixel size
900–1700 nm spectral response
38K @ 1024 × 1 line-scan output
14-bit ADC and 512 MByte memory

70% quantum efficiency @ 1550 nm
CameraLink Full interface
Global shutter design
Cooling up to 40 °C below ambient
M42 lens mount

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Product Details

Specifications
Model	SWIR1024L3A-CL40K
Sensor	China-made 1024-pixel line-scan sensor
Sensor Type	InGaAs short-wave infrared (SWIR) line-scan image sensor
Shutter Type	Global Shutter
Color Type	Monochrome
Resolution	1024 pixels (1024 × 1)
Sensor Size	25.6 mm
Pixel Size	12.5 µm × 12.5 µm
Spectral Range	900–1700 nm
Performance Specifications
Frame Rate	38K @ 1024 × 1
ADC	14 bit
Memory	512 MByte
Quantum Efficiency	70% @ 1550 nm
Dynamic Range	-
Exposure Time Range	1 µs - 1 s
Interface Specifications
Digital I/O	1 optocoupler-isolated input, 1 optocoupler-isolated output
Lens Mount	M42
Data Interface	CameraLink Full
Data Format	Mono 14
Cooling Capacity	40 °C below ambient temperature
Power Supply	DC 12 V
Software	SDK development kit and CLView software based on Delsa frame grabber
Physical & Environmental Specifications
Operating Temperature	Working temperature: -40 °C to 70 °C
Operating Humidity	20% to 80%, non-condensing
Storage Temperature	Storage temperature: -40 °C to 70 °C

Product Overview

SWIR1024L3A-CL40K is a China-made InGaAs SWIR line-scan camera engineered for high-speed online inspection, material sorting, spectral sorting, and continuous-web imaging. It combines a 2048-pixel line-scan sensor, CameraLink Full transport, and TEC cooling to deliver stable short-wave infrared imaging in demanding industrial workflows.

SWIR spectral response: covers 900–1700 nm for moisture analysis, material identification, and short-wave infrared process inspection.
High-speed line-scan acquisition: supports 38K @ 1024 × 1 to match continuous motion targets and inline inspection systems.
Stable signal chain: combines 14 bit ADC, 512 MByte memory, and Mono 14 output for reliable industrial data capture.
TEC cooling control: 40 °C below ambient temperature helps improve imaging stability and dark-noise control during long-duty operation.
Industrial system integration: CameraLink Full, 1 optocoupler-isolated input, 1 optocoupler-isolated output, and an M42 mount simplify integration into line-scan optical systems.
Software support: the camera is supplied with SDK development kit and CLView software based on Delsa frame grabber for configuration, acquisition, and secondary development.

Core Performance Highlights

Line Rate

38K @ 1024 × 1

Quantum Efficiency

70% @ 1550 nm

Interface

CameraLink Full

Product Summary

SWIR1024L3A-CL40K is optimized for high-speed SWIR line-scan applications where stable CameraLink transmission, short-wave infrared sensitivity, and dependable industrial integration matter most.

SWIR1024L3A-CL40K Product Manual

PDF format with detailed technical specifications and outline information

Download

SDK and CLView Software

Development kit and CameraLink acquisition software for system integration

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3D Model Files

STEP files for mechanical integration and enclosure design

Download 3D

Series Highlights#

Designed around high-speed line-scan inspection, SWIR sensitivity, and stable CameraLink integration

1024/2048-Pixel Line Scan

The series covers 38K @ 1024 × 1 and 79K @ 2048 × 1 models for continuous-motion inspection and inline production systems.

SWIR Material Discrimination

The 900–1700 nm response band is suited to moisture analysis, material sorting, silicon inspection, and other short-wave infrared recognition tasks.

Industrial Integration

CameraLink Full, isolated trigger I/O, M42 mounting, SDK support, and CLView software simplify integration into line-scan inspection systems.

Frequently Asked Questions

Learn more about SWIR short-wave infrared camera technology

Electromagnetic spectrum diagram: UV 200–380 nm, Visible light 380–750 nm, Near infrared 750–1100 nm, Short-wave infrared 1100–2500 nm, Long-wave infrared 8000–14000 nm

A SWIR camera is a professional imaging device that operates in the short-wave infrared spectrum (approximately 400–1700 nanometers). It can achieve imaging effects that go beyond visible light but differ from thermal imaging cameras (LWIR), making it widely applicable in scenarios requiring high standards for materials, structures, and details.

SWIR cameras have wide applications including industrial inspection, machine vision, material sorting, food testing, scientific research, medical diagnostics, security monitoring, process control, and transportation. They are particularly outstanding in material analysis, moisture detection, penetration through fog/smoke/dust, and night surveillance.

Yes! SWIR cameras can see through certain materials that are opaque to visible light, such as certain plastics and silicon wafers. This capability is extremely valuable for semiconductor inspection, material testing, and other industries.

SWIR cameras primarily capture reflected or emitted light in the short-wave infrared range, unlike thermal imaging cameras (LWIR) which rely on thermal radiation from objects. SWIR cameras have lower thermal sensitivity than thermal imaging cameras and are better suited for structural analysis and material identification rather than direct temperature detection.

Theoretically, yes. SWIR cameras can identify objects or components that cannot be distinguished in visible light through differences in reflection and transmission of materials under short-wave infrared light. They are widely used in security screening, industrial sorting, and inspection applications.

Deep Understanding of SWIR Cameras

Short-Wave Infrared (SWIR) cameras and their core sensors are important components of advanced imaging systems. SWIR technology covers the 900–1700 nanometer wavelength band and has excellent penetration capabilities in harsh environments, such as penetrating fog, smoke, and dust to achieve clear imaging under extreme conditions.

SWIR cameras primarily rely on short-wave infrared light reflection, similar to the visible light band, complementing the application range that thermal imaging cameras (LWIR) cannot cover, providing more complete imaging solutions. They are compact and flexibly integrated, making them easy to apply in various industrial and commercial systems.

The high resolution and high sensitivity of SWIR cameras can meet precision detection and high-requirement applications, capable of detecting minute changes and anomalies in samples, making them very suitable for quality control and defect detection. Some models support cooling, further ensuring imaging quality in high-temperature or high-noise environments.

To reduce system costs and improve integration efficiency, modern SWIR cameras commonly adopt standard optical interfaces and compact designs to accommodate broader application requirements. With the continuous development of imaging markets and technology, SWIR cameras have become one of the key technologies for high-end imaging and sensing in multiple industries due to their unique advantages.