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Low-Light Imaging (Low-Light Imaging)

The Low-Light Imaging series is designed specifically for extremely low illumination, long exposure, and high signal-to-noise ratio scenarios, incorporating four major deep cooling camera platforms: MTR3CCD, MTR3CMOS, ITR3CMOS, and CTR3CMOS. All models feature built-in dual-stage or single-stage TEC thermoelectric cooling modules that can reduce sensor temperature to –10 °C to –50 °C in ambient laboratory environments, significantly suppressing dark current and thermal noise. Combined with anti-fogging optical windows and exposure time control up to 1 hour, these cameras ensure pristine detail capture even under weak light or fluorescence conditions.

Deep Cooling & Anti-Fogging

Dual-stage TEC achieves –40 °C/–50 °C temperature reduction (MTR3 series) or lightweight TEC –10 °C (CTR3CMOS); sensor window features anti-condensation structure for fog-free long exposure imaging

Multi-Sensor Coverage

Sony ExView HAD CCD, Exmor/Starvis CMOS, and GSENSE back-illuminated CMOS, resolution 0.5 MP – 45 MP, sensor formats 2/3″ – 1.8″

Multi-Interface High-Speed Output

USB 3.0 as mainstream; CTR3CMOS / ITR3CMOS additionally support GigE for convenient laboratory and production line data acquisition

Long Exposure Stability

Dark current as low as 0.03 e⁻/s/pix (–50 °C), combined with 12/14/16-bit output and black level correction, meeting scientific-grade noise requirements for 1 h cumulative exposure

High Spectral Sensitivity Versions

RGB / Mono / NIR enhanced options available, peak quantum efficiency >90 % (GSENSE BSI models); suitable for fluorescence microscopy, chemiluminescence, night sky backgrounds, weak light imaging

Cross-Platform SDK

Includes ToupView imaging software and Windows / Linux / macOS / Android SDK, compatible with DirectShow, Twain, supporting secondary development and automation scripts

Key Technical Features

Highlight Description
Deep Cooling & Anti-Fogging Dual-stage TEC achieves –40 °C/–50 °C temperature reduction (MTR3 series) or lightweight TEC –10 °C (CTR3CMOS); sensor window features anti-condensation structure for fog-free long exposure imaging
Multi-Sensor Coverage Sony ExView HAD CCD, Exmor/Starvis CMOS, and GSENSE back-illuminated CMOS, resolution 0.5 MP – 45 MP, sensor formats 2/3″ – 1.8″
Multi-Interface High-Speed Output USB 3.0 as mainstream; CTR3CMOS / ITR3CMOS additionally support GigE for convenient laboratory and production line data acquisition
External Triggering & ROI ITR3CMOS/CTR3CMOS support hardware trigger, software trigger, and free-run modes, with programmable ROI, binning for multi-camera synchronization and high-speed sub-frame sampling
Long Exposure Stability Dark current as low as 0.03 e⁻/s/pix (–50 °C), combined with 12/14/16-bit output and black level correction, meeting scientific-grade noise requirements for 1 h cumulative exposure
High Spectral Sensitivity Versions RGB / Mono / NIR enhanced options available, peak quantum efficiency >90 % (GSENSE BSI models); suitable for fluorescence microscopy, chemiluminescence, night sky backgrounds, weak light imaging
Cross-Platform SDK Includes ToupView imaging software and Windows / Linux / macOS / Android SDK, compatible with DirectShow, Twain, supporting secondary development and automation scripts
Scientific & Industrial Dual Certification CE / FCC / RoHS certified; wide temperature design –20 °C–55 °C, capable of 24/7 continuous operation, adapting to both laboratory and industrial measurement environments

Core Specifications

–50 °C Minimum cooling temperature
1 hour Maximum exposure time
45 MP Maximum resolution
0.03 e⁻/s/pix Dark current (–50 °C)
>90 % Peak quantum efficiency
16-bit Maximum bit depth

Application Fields

Leveraging the ultra-low noise, long exposure time, and sensitive spectral capabilities of this series, users can achieve significant advantages in the following applications:

Fluorescence Microscopy & Live Cell Imaging
Weak emission signals can still present high contrast
μRaman / Photoluminescence Spectroscopy
Long integration without thermal noise accumulation
Material Defect / Semiconductor Inspection
Dark field, weak scattering defects clearly visible
Low-Light Scientific Photography
Chemiluminescence, protein detection, astronomical narrowband photography